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at CFN. FEM is based on capturing electron nanodiffraction (4D-STEM) to determine the medium range order (of the length scale of nanometers) of amorphous oxides, including those relevant to quantum
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CFN's state-of-the-art Facilities, such as Quantum Materials Press (QPress) and Nanofabrication Facilities, to unravel the influences of atomic defects in 2D materials on the steep-slope device
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