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microelectronic structures using ptychographic imaging techniques being developed at NSLS-II. The x-ray metrology pipeline will be utilized for characterization of microelectronic structures being developed at IO
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materials for the next generation of microelectronics and quantum information science and technology. Position Description: We are looking for a Postdoctoral Research Associatefor a 1-year term , to grow high
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-slope transistors for energy-efficient microelectronics applications as a part of a DOE Microelectronics Science and Research Center (MSRC) project. You will explore the materials and device physics of 2D
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