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integrated alpha radiation sources Performing post-mortem analyses (electron microscopy e.g. EPMA, SEM, and X-ray methods e.g. µCT, XRD) Preparing and evaluating solution analyses using ICP MS/OES Publishing
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. The content of the research activity: Archeometallurgical analyses SEM-EDS microscopy and chemical composition analysis of iron artifacts, slags, and ores GIS spatial analysis, statistical analysis, and network
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(electron microscopy e.g. EPMA, SEM, and X-ray methods e.g. µCT, XRD) Preparing and evaluating solution analyses using ICP MS/OES Publishing and presenting research results at national and international
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includes https://doi.org/10.1101/2025.0... and https://doi.org/10.64898/2025.... Profile You have: An MSc (or equivalent) in structural biology, cell biology, biophysics, bioengineering
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DTU Tenure Track Researcher on Nanoreactors for Operando Visualizations of Nanoparticle Catalysis...
manipulation (graphene and hBN in particular), controlled nanoparticle deposition and characterization using surface science techniques including both AFM, SEM, and XPS. In addition, you must have comprehensive
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microenvironment in these foraminifera. Novel techniques including high-pressure freezing and fluorescent/ cry-FIB SEM imaging will be applied and will complement experiments at the NIOZ. Handling living
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Microscopy (SEM) studies and Atomic Force Microscopy (AFM) investigations. Bibliography: 1) M. Kowalczyk et al. Optical Materials Express 6, 2273-2282 (2016). 2) R.-N. Verrone et al. ACS Applied Nano Materials
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/Qualifications MSc in physics, chemistry, materials science, or similar. Experience working with various nanostructures, especially in electron microscopy (both SEM (Scanning Electron Microscopy) and TEM
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using advanced analytical techniques, including TED-GC/MS (Thermal Extraction Desorption–Gas Chromatography Mass Spectrometry) to quantify microplastic mass, SEM-EDX (Scanning Electron Microscopy with
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paramagnetic resonance (EPR), or magnetic resonance imaging (MRI) Familiarity with analytical tools: X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray computed tomography (XRCT) Expertise in