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characterization techniques such as XRD, N2 adsorption, FESEM, TEM, XAS, XPS, dissolution-NMR, IR spectroscopy and TGA and other related spectroscopy techniques such as UV and fluorometer. Skilled in performing
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Quantum Materials and Devices – Deng Research Group Prof. Bingchen Deng (https://luddy.indiana.edu/contact/profile/index.html?bingchen_deng) in the Department of Intelligent Systems Engineering at Indiana
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force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and secondary ion mass spectrometry (SIMS). Electrical properties will be evaluated using Hall effect
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