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and separation applications. From the crystal structure study, we can understand the fundamental physics and chemistry of these materials, in order to improve their properties for desired applications
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coatings, Applied Physics Reviews 5, 011103 (2018). Christopher S. Yung, Nathan A. Tomlin, Karl Heuerman, Mark W. Keller, Malcolm G. White, Michelle Stephens, John Lehman, Plasma modification of vertically
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optical microscopes to provide physical measurements (e.g. mass, size, concentration, composition) of individual nanoparticles. We are seeking candidates with backgrounds in optics, microscopy
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NIST only participates in the February and August reviews. The need to reduce building energy consumption is well-established and has been the subject of research for many decades. More recent policy motivations have made building energy efficiency even more pressing. However, energy savings...
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NIST only participates in the February and August reviews. NIST has a long tradition of producing highly impactful Standard Reference Materials (SRMs), which typically have a single certified value or exceptionally well characterized property with known uncertainties. New biological “’omics”...
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surface composition, surface reactivity, stability, physical state and functional performance (nano-analytics). Research focuses on (1) the development of measurement methods and instrumentation
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NIST only participates in the February and August reviews. The roll out of high-speed, low-latency communications networks is expected to drive economic growth through automation while creating new markets spaces that include self-driving cars and augmented reality. At the hardware level, the...
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RAP opportunity at National Institute of Standards and Technology NIST Atom-Based High Power Laser Intensity Measurements Location Communications Technology Laboratory, Radio Frequency Technology Division opportunity location 50.67.22.C1099 Boulder, CO NIST only participates in the February...
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RAP opportunity at National Institute of Standards and Technology NIST Functionalizing Semiconductor Surfaces Location Physical Measurement Laboratory, Nanoscale Device Characterization Division
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NIST only participates in the February and August reviews. Microsensor systems are constructed from modular components that include device platforms, sensing materials, control and signal-acquisition circuitry, and signal-processing/pattern-recognition algorithms. The sensors must be tailored...