397 computer-security "https:" "https:" "https:" "https:" "https:" "U.S" "U.S" "St" uni jobs at NIST
Sort by
Refine Your Search
-
for accelerated science. This research opportunity focuses on developing, evaluating, and applying computational methods for materials characterization and/or simulation that combine the best aspects of physics
-
regimes, and accurate geometry- and biochemistry-based trajectory analyses. However, detailed molecular dynamics simulations are often too time-consuming to become the basis of computational measurements
-
component of aggregate in concrete. key words reactive minerals, concrete, aggregate, deterioration, durability, Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend
-
group is working on a dual-track project to expand this class of materials, and the successful candidate will contribute to either the computational discovery or the experimental validation (or both
-
Green’s functions; NV center in diamond; Phosphorene; Quantum computer materials; Silicene; Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel
-
intelligence; Materials Science; Autonomous Experimentation; algorithm development; materials property prediction Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base
-
; Nanoparticles; Nanotubes; Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00
-
generation magnetic data storage. Research projects will include using X ray and neutron scattering to characterize the fidelity of the block copolymer structure to the template and computer simulations of
-
; Micromechanical; Nanomechanical; Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00
-
manufacturing. key words EUV lithography; Holographic microscopy; Extreme ultraviolet radiation; EUV damage; Optical scatterometry; Semiconductor manufacturing; Eligibility citizenship Open to U.S. citizens level