413 computer-science-quantum-"https:"-"https:"-"https:"-"https:"-"https:"-"Univ" positions at NIST in United States
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individuals responsible. NIST provides the foundational measurement science needed to advance threat detection and improve the accuracy of nuclear forensics measurements. This includes the delivery of standard
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For predicting thermochemistry of small main-group molecules, quantum chemistry is sufficiently reliable that it can be used to settle experimental disagreements and to provide critical data that are not available
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world-class, unique controls and measurement capabilities, and flexibility to incorporate new research instrumentation and ideas. Further, our measurement facilities include X-ray computed tomography
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Robotic Systems for Smart Manufacturing Program is developing the measurement science needed to enable manufacturers to characterize and understand the performance of robotics systems within
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Poppendieck dustin.poppendieck@nist.gov 301.975.8423 Description This program is designed to provide the measurement science to support the development of industry-consensus standards and guides related
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RAP opportunity at National Institute of Standards and Technology NIST Micro- and Nano-Optomechanical Systems Location Physical Measurement Laboratory, Quantum Measurement Division opportunity
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are particularly interested in developing and characterizing hybrid quantum systems (interfaces between dissimilar physical media), suitable for quantum information purposes, and exotic sources of faint light
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RAP opportunity at National Institute of Standards and Technology NIST Microsystems for Massively Multiplexed Molecular Biology Location Material Measurement Laboratory, Biosystems and
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corrected for, the noise and drift can directly affect not only the initial calibration of qubits, but also the coherence times and, ultimately, fidelities of the quantum control and readout operations
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RAP opportunity at National Institute of Standards and Technology NIST Enabling Advanced Functionalities in Photonics using Low-Dimensional Semiconductors Location Material Measurement