329 embedded-system-"https:"-"https:"-"https:"-"https:"-"UCL" positions at NIST in United States
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typically employ near-UV (355 nm) lasers. This is problematic because specimens of interest are often nanostructures variously composed of semiconductors, metals, oxides, nitrides--and sometimes even
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5235 Description Corrosion is estimated to cost $2.5 trillion dollars annually, of which ~$500 billion could be saved by the application of existing technologies. But for the remaining $2 trillion, a
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microfluidic networks.Our goal is to develop systems that enable accurate, high-throughput, and dynamic measurement of materials in flow, which will, for example, improve the ability to specify composition and
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modeling is the parametrization of the force field. There are a large number of force fields in existence and significant efforts are spent on their development and improvement. However, to-date, development
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Obrzut jan.obrzut@nist.gov 301.975.6845 Christopher L. Soles christopher.soles@nist.gov 301.975.8087 Description This research is focused on the development and use of cellulose nanocrystals (CNC) in
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NIST only participates in the February and August reviews. Co-advisor: Dr. Angela Stelson, S-parameters calibration lead. Commercial acoustic spectroscopy is stuck below 300 MHz, which limits our
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Description Enriched silicon is critical for silicon quantum devices since the 29Si isotope is a leading contributor to qubit decoherence. Enriching silicon leads to long quantum coherence times (T2) measured
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daniel.sunday@nist.gov 301 975 4921 Description Conventional optical-based photolithography is reaching the limits of scaling for the patterning and fabrication of nanoscale devices. The semiconductor industry
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: Developing computational methods to propagate quality issues, such as uncertainty, from upstream data sources to downstream digital objects. This propagation is crucial for ensuring the overall trustworthiness
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@nist.gov 301.975.6832 Description The goal of this research is to advance vibrational spectroscopy techniques for selective and sensitive characterization of the higher order structure (HOS) of proteins