Sort by
Refine Your Search
-
fabrication by sputtering (e.g., magnetron sputtering; thin-film deposition workflows). • Materials characterization methods (morphology, structure, composition), e.g., SEM/EDS, XRD, profilometry, IBA, etc
-
+ EDX • Fully Automated FIB Helios 5UX • FEI SEM Quanta and SEM Magellan About the ICN2: As a flagship research center in nanoscience and nanotechnology, our mission is to open and explore new frontiers
-
workflows to accelerate the discovery and optimization of advanced materials for energy applications. Within the SEMS group at IREC, the main objective is the implementation of an automated experimental
-
of the printed layers using profilometry, SEM and AFM to ensure optical quality and adhesion. Leading the production of smart window modules. Where to apply Website https://seuelectronica.upc.edu/en/procedures