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particle geometry in three dimensions using slice-and-view FIB-SEM analysis. Determining mineralogical and chemical properties (composition, zoning, crystallographic orientation) using complementary electron
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using advanced analytical techniques, including TED-GC/MS (Thermal Extraction Desorption–Gas Chromatography Mass Spectrometry) to quantify microplastic mass, SEM-EDX (Scanning Electron Microscopy with
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techniques, including X-ray diffraction, XPS, SEM-EDX, and in situ Raman and IR during electrocatalytic experiments. The performance of the selected materials will be investigated in the lab and in a pilot
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of silicon with only preliminary exploration of in-SEM scratching. Building upon the preliminary in-situ SEM scratch exploration, the following extensions and improvements need to be made: Develop a method to
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‘engineers of the future’ with the knowledge and the skills they will need to impact science, innovation, and society, from regional to global scales. Where to apply Website https://www.academictransfer.com/en
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to reduce the stack pressure required for cycling using functional interlayers. You will use techniques such as EIS, solid-state NMR, FIB-SEM, and various electrochemical methods to characterize materials and
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characterization using cryo-electron tomography (cryo-ET), and complementary light microscopy methods. Specific objectives are: Setting up cryo-ET FIB SEM workflow for reconstituted synapses Visualize nanoscale