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hydrothermal methods. Structural and Chemical Characterization using: X-ray Powder Diffraction (XRD) and Rietveld refinement for phase analysis. Electron microscopy (SEM, TEM, EDS) for morphology and elemental
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platforms like Aspen Plus. In-depth knowledge of electron microscopy, spectroscopy, and structural analysis methods for complex materials. Familiarity with REE and vanadium chemistry, oxidation states, and
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and thickness. Perform comprehensive characterization of perovskite thin films using techniques such as X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and UV
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