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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated
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. The Institute de Chimie Physique, UMR 8000 CNRS, Université Paris-Saclay provides full characterization equipment, which includes the majority of the necessary equipment for the project, such as TEM, Time
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. - Structural and biochemical characterization of DNA origami using TEM, AFM, Cryo-EM, gel electrophoresis, and fluorescence-based assays. - Engineering of dynamic and stimuli-responsive DNA origami nano-machines
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) present in hBN using transmission electron microscopy (TEM). - Identification of the structural properties of point defects (nature, density) and stacking defects (number of layers, twist angle, stresses
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between structure and properties. More precisely, the project will stem from the recognized expertise of the CEMES laboratory in in-situ TEM nanoindentation [1] to identify key deformation mechanisms
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catalysts. - Characterize the prepared catalysts using standard techniques (XRD, ICP, XPS, HR-TEM, Raman, FTIR, elemental analysis, N2 adsorption). The most active materials will be characterized using
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& Spectrochimie (https://www.lcs.ensicaen.fr ) located in Caen (Normandy). The LCS has built its reputation on the preparation of zeolites and related porous materials. The selected candidate will be attached
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/injection molding), morphological characterization (e.g., TEM, AFM, SEM, X-ray scattering), and thermomechanical characterization (e.g., peeling tests, tensile testing, calorimetry, rheology). The laboratory
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diamond-anvil cell laboratory, a large-volume press laboratory (piston-cylinder, Paris-Edinburgh presses, multi-anvil press), a femtosecond laser micro-machining facility, electron microscopes (SEM, TEM
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, Nature Materials, 12, 426 (2013). (http://dx.doi.org/10.1038/NMAT3581 ) 2 - U. Kumar, G. Colas des Francs, A. Bouhelier, E. Dujardin, et al. ACS Photonics, 5, 2328-2335 (2018). (https://doi.org/10.1021