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RAP opportunity at National Institute of Standards and Technology NIST Applied Optimization and Simulation Location Information Technology Laboratory, Applied and Computational Mathematics
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NIST only participates in the February and August reviews. Knowledge of fluid thermophysical properties is vital for applications in industry, metrology, and environment. The tools of statistical mechanics (Monte Carlo or molecular dynamics simulation, calculation of virial coefficients from...
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RAP opportunity at National Institute of Standards and Technology NIST Materials Discovery Using Synchrotron Radiation, Machine Learning, and Artifical Intelligence Location Material Measurement
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learning; Data informatics; Physics; Terahertz; Metrology; Chemistry; Materials engineering; Eligibility Citizenship: Open to U.S. citizens Level: Open to Postdoctoral applicants Stipend Base Stipend Travel
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informatics and programming. Some of the programming skills required include web-based markup languages, experience with SQL databases, and proven record of accomplishment using data informatics. Reference
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Metrology for Quasi-Optical Wireless Probing of Monolithic Microwave Integrated Circuits NIST only participates in the February and August reviews. Ultrafast electronic devices with fundamental operating frequencies above 100 GHz are used in a wide variety of applications—examples include radio...
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absorption fine structure), development of data-analysis approaches and computer software for simultaneous structural refinements using multiple types of data combined with ab initio theoretical modeling
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://jarvis.nist.gov/) infrastructure uses a variety of methods such as density functional theory, graph neural networks, computer vision, classical force field, and natural language processing. We are currently
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RAP opportunity at National Institute of Standards and Technology NIST Lightweight Cryptography for Resource Constrained Applications Location Information Technology Laboratory, Computer
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include the development of novel polymeric mechanical testing devices, novel adhesion blister testing devices, development of high-throughput screening devices, informatics, and data base development. key