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their structural and optical characterization by using atomic force microscopy (AFM), scanning electron microscopy (SEM), x-ray diffraction (XRD), and photoluminescence spectroscopy (PL). The research will be
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their structural and optical characterization by using atomic force microscopy (AFM), scanning electron microscopy (SEM), x-ray diffraction (XRD), and photoluminescence spectroscopy (PL). The research will be
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broad experience in the development of electronic structure methods and their application in order to perform atomistic simulations of molecules and materials. These include (but are not restricted
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broad experience in the development of electronic structure methods and their application in order to perform atomistic simulations of molecules and materials. These include (but are not restricted