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in materials characterization usingadvanced electron microscopy, including: Scanning Electron Microscopy (SEM), Electron Back Scatter Diffraction (EBSD), Electron Channeling Contrast Imaging (ECCI
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skilled researcher with a strong background in materials characterization using advanced electron microscopy, including: Scanning Electron Microscopy (SEM), Electron Back Scatter Diffraction (EBSD
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include experience performing particle size analyses with laser particle analyzers, Atterberg limits, undrained shear strength, resedimentation, consolidation, and X-ray diffraction. These required and
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