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Exploring Material Behavior Across Scales: Mechanical Characterization, Microstructural Analysis, FEA/AI/ML Modeling, and Automation Approaches NIST only participates in the February and August reviews. This research topic is not limited to the methods or techniques discussed below. We encourage...
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of aqueous chemical models, incorporated into computer codes, for both pure and applied research that include industrial chemistry, chemical engineering, water treatment, hydrometallurgy, toxicology, medical
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NIST only participates in the February and August reviews. This suite of projects seeks to advance the microbial metabolomics infrastructure through the development of new analytical methods, including data analysis and novel statistical approaches. We are particularly interested in...
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RAP opportunity at National Institute of Standards and Technology NIST Magnetic Resonance in Industrial Applications Location Physical Measurement Laboratory, Applied Physics Division opportunity location 50.68.62.C0945 Boulder, CO NIST only participates in the February and August...
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to reliable manufacturing of the next generation computing devices. Computational imaging methods such as coherent diffractive imaging, Fourier ptychography, structured illumination techniques, and other super
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NIST only participates in the February and August reviews. Metals-based additive manufacturing (AM) encompasses several different technologies that enable the controlled fusing, melting, and consolidation of precursor metal materials into metal 3D parts and structures, enabling complex geometry...
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RAP opportunity at National Institute of Standards and Technology NIST Applied Mathematics of Soft, Fluid, and Active Matter Location Information Technology Laboratory, Applied and Computational
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outbreak of a novel E. coli strain O104:H4. However, this can be difficult using the existing platforms and software because of the constraints on sequencing (read length, depth), and informatics (e.g
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application spaces including mobile computing and communications, health and medical devices, automotive, high-performance computing, internet of things (IoT), and aerospace and defense. key words millimeter
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301.975.6050 Jan Obrzut jan.obrzut@nist.gov 301.975.6845 Description As part of a collaborative NIST-wide program involving structural characterization, modeling, and high-throughput microwave measurement, we