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Field
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• Experience in characterization of functional oxide thin films, including diffraction techniques (XRD, XRR, RSM), electron microscopy (SEM, EDX and TEM), Atomic Force Microscopy (AFM), X-ray photoelectron
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» Electronics Engineering » Materials engineering Researcher Profile Recognised Researcher (R2) Positions Postdoc Positions Country Belgium Application Deadline 10 Sep 2025 - 17:00 (Europe/Brussels) Type
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of their trapping and diffusion behavior. The tasks specifically include hydrogen charging, high-pressure torsion deformation, mechanical testing, structural characterization by advanced electron microscopy and site
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Postdoctoral Research Associate in Sum-Frequency Generation Microscopy of Biomolecular Self-Assembly
Research Associate (d/f/m) in Sum-Frequency Generation Microscopy of Biomolecular Self-Assembly with a duration of up to 3 years. In this position, you would join the project using the recently developed and
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-mechanical testing of interfaces in multilayered films across a wide range of temperatures (cryogenic to elevated temperatures) and strain rates using in situ SEM techniques Electron microscopy-based
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: bacteriology, fluorescence microscopy, electron microscopy, antibiotic assays, biochemical purifications, biochemical assays such as binding assays and protein gel electrophoresis, as well as analytical methods
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investigations of material properties of ultra-thin silica membranes (through e.g. transmission-electron microscopy). The scholarship is for two (2) years and is funded by the Kempe Foundations. The tax-free
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Postdoc Positions Country Portugal Application Deadline 16 Sep 2025 - 23:00 (Europe/Lisbon) Type of Contract Temporary Job Status Full-time Hours Per Week 40 Is the job funded through the EU Research
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methods. Structural and Chemical Characterization using: X-ray Powder Diffraction (XRD) and Rietveld refinement for phase analysis. Electron microscopy (SEM, TEM, EDS) for morphology and elemental
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. Structural and Chemical Characterization using: X-ray Powder Diffraction (XRD) and Rietveld refinement for phase analysis. Electron microscopy (SEM, TEM, EDS) for morphology and elemental distribution