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are often destructive, insufficient in resolution and sensitivity, and are subject to bias inherent in the measurement process. New methods for quantitative, in situ characterization are essential for gaining
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SS, Gu X: “Depth profiling of degradation of multilayer photovoltaic backsheets after accelerated laboratory weathering: Cross-sectional Raman imaging”. Solar Energy Materials & Solar Cells 144: 289
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simultaneous measurements on individual particles making use of lab-on-a-chip technology. Techniques include microsecond flash photography (including fluorescence), image analysis, and electrical signals
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of measurements and simulations is increasingly used to improve the understanding of mechanical testing results and provides a means to advance the mechanical testing paradigm toward fewer, more complex tests that
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on characterizing such novel magnetic behavior and understanding the origin of the new phenomena, so that the relationship between structure, processing, and properties can be established. Such a relationship is
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NIST only participates in the February and August reviews. The Alternative Computing Group at NIST has an ongoing program developing new metrologies to support emerging information processing
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301.975.3792 Description Post-doctoral positions are available to advance materials, methods, and instrumentation for electron paramagnetic resonance (EPR) spectroscopy measurements of nanomaterials and
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opportunities are available in developing integrated nanophotonic architectures and devices for realizing compact, efficient, accurate and dynamic quantum AMO systems-on-a-chip. By creating a set of scalable
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three-dimensional structure within a biofilm would provide information and insight into biofilm behaviors. This research opportunity involves using advanced imaging techniques coupled with quantitative
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, computer scientists, data scientists, and data engineers to define and implement community standards for knowledge representation and interchange. The successful applicant will conduct novel research in