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microelectronic structures using ptychographic imaging techniques being developed at NSLS-II. The x-ray metrology pipeline will be utilized for characterization of microelectronic structures being developed at IO
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, encryption/decryption and compression; use of microelectronics devices (including COTS); implementation, inference, verification and validation of algorithms** on processing hardware platforms for space
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-centre/expertise/microelectronics-group?az= You will have a strong background and keen interest in nanoelectronics, microelectronics, semiconductor devices and VLSI technology. You will hold or be nearing
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