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Postdoc Development of a Low-Voltage Multi-Beam SEM for High-Throughput Imaging | TU Delft Job description Scanning Electron Microscopy (SEM) plays a central role in today’s nanoscale imaging across
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candidate at TU Delft, working in close collaboration with our industrial partner Delmic and academic partner AMOLF, you will develop a proof-of-concept prototype of a low-voltage multi-beam SEM that combines
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applications. As a PhD candidate at TU Delft, working in close collaboration with our industrial partner Delmic and academic partner AMOLF, you will develop a proof-of-concept prototype of a low-voltage multi
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