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Mathematics » Computational mathematics Physics » Thermodynamics Researcher Profile First Stage Researcher (R1) Positions PhD Positions Country Switzerland Application Deadline 31 Oct 2025 - 23:59 (Europe
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Mathematics » Computational mathematics Physics » Thermodynamics Researcher Profile First Stage Researcher (R1) Positions PhD Positions Country Switzerland Application Deadline 31 Oct 2025 - 23:59 (Europe
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application will receive fair consideration. Challenge. Change. Impact! Faculty of Electrical Engineering, Mathematics and Computer Science The Faculty of Electrical Engineering, Mathematics and Computer
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Science, or related disciplines. You have an aptitude for experimental research and data analysis. Experience with programming and/or mathematical modelling is an advantage. Excellent written and oral
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or to combine multiple smaller-scale systems into a farm? The cost model will be augmented with a life cycle analysis to incorporate the environmental impact of the used materials into the analysis. All relevant
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3 Sep 2025 Job Information Organisation/Company University of Amsterdam (UvA) Research Field Computer science » Informatics Computer science » Programming Mathematics » Algorithms Mathematics
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description of the wind resource and physics-based models of the AWE system will be combined with a cost model of the farm. Is it better to scale up the individual systems or to combine multiple smaller-scale
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an international, interdisciplinary team of 17 doctoral candidates, based at universities and industrial firms throughout Europe. You will be supported by two mentors within the SPACER project and will have multiple
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Max Planck Institute for the Physics of Complex Systems • | Dresden, Sachsen | Germany | about 23 hours ago
condensed matter physics. We are looking for highly talented and motivated students from all around the world to join our affiliated research groups. Multiple PhD positions will be awarded on a competitive
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geometry can be reconstructed mathematically (this is called inverse scattering). This requires both sophisticated mathematical models and efficiently implemented algorithms. In the case of wafer metrology