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will extend this method to be used in forward and inverse scattering problems applicable to wafer metrology. This will involve developing the solver to be used for complex scattering geometries
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this method to be used in forward and inverse scattering problems applicable to wafer metrology. This will involve developing the solver to be used for complex scattering geometries, elaborate illumination
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, this is often how the problem is approached. In this project, we aim to build a framework to perform a joint inversion of interior parameters with integrated geophysical observations. This framework will
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separately provide only a partial picture of the interior. Still, this is often how the problem is approached. In this project, we aim to build a framework to perform a joint inversion of interior parameters