3 finite-element-analysis Postdoctoral positions at University of Twente in Netherlands
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learning models for real-time image and video analysis (e.g., segmentation, object tracking, reinforcement learning), with applications to medical imaging and robotic systems. In this role, you will
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10-100 nm would be required, varying in absolute value over the surface of the wafer. An elegant method to correct wafer position is to include an adaptive element into the wafer stage, which allows
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materials performance. Developing the understanding of the piezoelectric film structures and their functional properties using characterization techniques such as AFM, XRD, SEM and DBLI and detailed analysis
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