Sort by
Refine Your Search
-
Category
-
Country
-
Employer
- ;
- ; The University of Manchester
- Monash University
- University of Nottingham
- ; University of Cambridge
- ; University of Leeds
- ; Brunel University London
- ; EPSRC Centre for Doctoral Training in Green Industrial Futures
- ; Imperial College London
- ; University of Birmingham
- ; University of Warwick
- DAAD
- ETH Zurich
- Forschungszentrum Jülich
- Leibniz
- Leiden University
- Max-Planck-Institut für Kohlenforschung, Mülheim an der Ruhr
- Technical University of Denmark
- University of Alabama, Tuscaloosa
- University of Cambridge
- University of Nebraska–Lincoln
- 11 more »
- « less
-
Field
-
-probe spectroscopy is used to follow electron mobility and recombination dynamics on a picosecond to nanosecond timescale. Unfortunately, due to the diffraction limit, the dynamics on a sample are
-
electron microscopy, transmission electron microscopy, focus ion beam, and X-ray diffraction. In addition, understanding of nanophase sintering of powders, ball milling, and construction of relevant power
-
scattering experiments with free electron lasers offer a new route to the structure determination of biomolecules. Due to the super-low signal-to-noise-ratio, computing the structure from such data is
-
conventional Zr alloys that result in the observed differences in irradiation-induced growth behaviour. Some key characterisation techniques that will be used are SEM, Transmission electron microscopy (TEM
-
also be correlated with the crystallography of the microstructure via electron backscatter diffraction (EBSD). We are seeking a motivated researcher with a passion for metallurgy and materials
-
Electron Microscopy (SEM) and X-ray Diffraction (XRD) to determine material crystal structure; low energy deuterium exposure using the DELPHI-II system to introduce D at the near surface regions
-
good experience in characterisation of thin films, including X-ray diffraction, electron microscopy (SEM, EDX and TEM), Atomic Force Microscopy (AFM), X-ray photoelectron spectroscopy (XPS), ellipsometry
-
optimal operating conditions and followed by surface analysis techniques (e.g. Scanning electron microscope, X-ray diffraction for residual stress measurements, Electron Back-Scattered Diffraction and
-
the conventional manufacturing process of advanced aerospace materials but also the state-of-the-art materials investigation such as scanning electron microscope (SEM), X-ray diffraction (XRD), electron backscatter
-
ferroelectric thin films. Additional structural and functional characterization tools will be employed (scanning probe microscopy, X-ray diffraction, transmission electron microscopy and many more...) We will set