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, interactions, conductivity, and microstructure of these fluids in order to understand how we can use nanoscale engineering of the suspensions to lower viscosity, increase conductivity, and increase storage
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RAP opportunity at National Institute of Standards and Technology NIST Biofuels: Enabling the Transition by Advancing Thermophysics Location Material Measurement Laboratory, Applied Chemicals
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Bias-induced Strain Mapping of Electronic and Energy Materials in an Atomic Force Microscope NIST only participates in the February and August reviews. Strain is induced when an electric field is
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RAP opportunity at National Institute of Standards and Technology NIST Nanoscale Magnetic Materials Location NIST Center for Neutron Research opportunity location 50.61.01.B1993 Gaithersburg, MD
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infrastructure to its limits. Naturally, engineers have pushed existing devices and networks to ever-increasing frequencies in an effort to address this multifaceted problem by improving data rates and adding
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Causal Green’s Function for Modeling of Phonon Transport in Nanoscale Semiconductors: Application to Devices for Thermal Management and Energy Applications NIST only participates in the February and August reviews. Efficient thermoelectric and thermal management devices consist of complex...
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RAP opportunity at National Institute of Standards and Technology NIST Nanoscale Characterization of Photovoltaic Materials and Devices Location Physical Measurement Laboratory, Nanoscale Device
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based on a planar lipid bilayer architecture to complement neutron scattering studies on peripheral membrane protein structure. The first, bilayer overtone analysis, involves measurement of the electric
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to characterize 2D materials, semiconductor devices, and biological materials from DC to the THz regime. The measurements enable the engineering of dielectric, magnetic and electrical transport properties of thin
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RAP opportunity at National Institute of Standards and Technology NIST Nanomagnetism-Dynamics Location Physical Measurement Laboratory, Nanoscale Device Characterization Division opportunity