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Description By creating photon states with photon numbers of more than one, it is possible to make measurements with resolution beyond conventional limits. For example, in interferometric applications
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NIST only participates in the February and August reviews. The modern transmission electron microscope (TEM) is capable of atomic-resolution structural and chemical imaging. However, such data
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301.975.8087 Description One of the benefits of nanoimprint lithography (NIL) is that it can directly pattern functional materials, not just sacrificially resist formulations that are used to transfer
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NIST only participates in the February and August reviews. The goal of this project is to develop nano-electromagnetic imaging using scanning microwave, NV center, and magnetic resonance microscopy
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wyatt.vreeland@nist.gov 202 550 7183 Description Biological systems are inherently complex-the quantitative characterization of the state of such a system requires simultaneous measurement of many properties. Our
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browsing capabilities. A small subset of project relevant publications is listed below. Requirements:A candidate should have at least a master’s degree in computer science or related fields (PhD is preferred
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of phase distributions, grain sizes, texture, and residual stresses in both as-built and heat-treated materials. Model results will both be informed by and feed into parallel work in macroscale
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transmission electron microscopy (TEM) and in situ atomic force microscopy (AFM) studies of how these slip structures evolve on pure Al single crystals and follow-up work on Cu is underway. Such studies provide
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landscapes for promoter activity based on steady state population distributions and measures of fluctuations in individual cells. We have previously applied Langevin/Fokker Planck equations to predict rates
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is how chain architecture, main chain stiffness, and side group flexibility impacts the elastic modulus of ultrathin polymer films. Additionally, we are developing methods for quantifying the tensile