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Field
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time-resolved hard X-ray diffraction microscopy and spectroscopy on single-crystalline bulk and thin film quantum materials (e.g. ferroelectrics, multiferroics, strongly correlated electron systems
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Requisition Id 15388 Overview: We are seeking a Postdoctoral Research Associate who will work at the interface between three different groups: the Single Crystal Diffraction Group in the Neutron
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are performed using the so called “Coherent Diffraction Imaging” approach. It allows a 3D imaging of isolated objects smaller than 6 μm in size. It has been used to study “objects” ranging from exoskeletons
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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diffraction-based techniques and electron diffraction methods \[MR1\] is essential for the role, and candidates should make their relevant experience for materials discovery clear in their application. The post
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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated
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, with a clear link to X-ray based analytical methods, especially to X-ray diffraction and if possible, X-ray imaging. We expect the candidate's enthusiasm for interdisciplinary work related to Space
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diffraction and if possible, X-ray imaging. We expect the candidate's enthusiasm for interdisciplinary work related to Space sciences. The working place will be Dübendorf / Zurich. Postdoc in "Development and
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, including X-Ray diffraction, scanning electron microscope, atomic force microscopy Additional comments NA Website for additional job details https://emploi.cnrs.fr/Offres/CDD/UMR137-JULGRO0-024/Default.aspx
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based