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analytical techniques at Warwick using Warwick’s Research Technology Platforms and facilities in WMG, spanning X-ray diffraction, spectroscopy and electron microscopy. The student will gain hands-on experience
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for understanding natural magmatic processes on earth & other planetary bodies. Neutron diffraction is a powerful technique for studying the atomic scale structure of these materials, but the current technology to
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of the project, which may include in-situ mechanical testing, metal forming techniques, investigative techniques including metallography, electron microscopy, electron backscatter diffraction, and tomography
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diffraction, and differential scanning calorimetry Mechanical performance assessment, including small-scale tensile testing and in situ testing at Diamond Light Source The studentship is fully funded for 3.5
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the opportunity to work with data from the European XFEL facility at DESY. Project website: https://www.mpinat.mpg.de/628848/SM-Ultrafast-XRay-Diffraction Your profile Eligible candidates have strong skills in
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electron microscopy, transmission electron microscopy, focus ion beam, and X-ray diffraction. In addition, understanding of nanophase sintering of powders, ball milling, and construction of relevant power
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includes the detailed elucidation of atomic and electronic structures, and physical properties. The group is in possession of state-of-the-art diffraction instrumentation and single-crystal electron and X
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optimal operating conditions and followed by surface analysis techniques (e.g. Scanning electron microscope, X-ray diffraction for residual stress measurements, Electron Back-Scattered Diffraction and
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the conventional manufacturing process of advanced aerospace materials but also the state-of-the-art materials investigation such as scanning electron microscope (SEM), X-ray diffraction (XRD), electron backscatter
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good experience in characterisation of thin films, including X-ray diffraction, electron microscopy (SEM, EDX and TEM), Atomic Force Microscopy (AFM), X-ray photoelectron spectroscopy (XPS), ellipsometry