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image analysis (segmentation, statistical feature extraction etc.) The project is part of a larger collaboration involving the Faculties of the University of Twente and a large industrial company
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materials performance. Developing the understanding of the piezoelectric film structures and their functional properties using characterization techniques such as AFM, XRD, SEM and DBLI and detailed analysis
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value using efficient, solid and sustainable technology. We are part of a ‘people-first' university of technology, taking our place as an internationally leading center for smart production, processes and
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