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postdoctoral position is available in the Geometric Machine Learning Group at Harvard University, led by Prof. Melanie Weber. This role offers an opportunity to perform research at the intersection of Geometry
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Application Deadline 13 Nov 2025 - 00:00 (UTC) Type of Contract Permanent Job Status Full-time Is the job funded through the EU Research Framework Programme? Not funded by a EU programme Is the Job related to
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of quantum experiments and quantum algorithms for computational geometry problems. Prior expertise in these areas is highly encouraged. The selected candidate will work on cutting edge technologies in
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, Quantum Geometry Prof. Moon Jip Park (Hanyang University) – Condensed Matter Physics, Topology, Non-Hermitian Systems, Statistical Physics Prof. Youngseok Kim (Ohio State University) – Quantum Computation
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, the scattering geometry can be reconstructed mathematically (this is called inverse scattering). This requires both sophisticated mathematical models and efficiently implemented algorithms. In the case of wafer
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polarization along with novel quantum geometries and topologies. We seek candidates with expertise in developing modern tools involving artificial intelligence, data science, and machine learning algorithms
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of quantum experiments and quantum algorithms for computational geometry problems. Prior expertise in these areas is highly encouraged. The selected candidate will work on cutting edge technologies in
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Framework Programme? Not funded by a EU programme Is the Job related to staff position within a Research Infrastructure? No Offer Description PhD Position in Soccer Analytics The Algorithms and Visualization
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Application Deadline 12 Oct 2025 - 00:00 (UTC) Type of Contract Permanent Job Status Full-time Is the job funded through the EU Research Framework Programme? Not funded by a EU programme Is the Job related to
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geometry can be reconstructed mathematically (this is called inverse scattering). This requires both sophisticated mathematical models and efficiently implemented algorithms. In the case of wafer metrology