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Projects Department (EOP-P) and with the Directorate of Technology, Engineering and Quality (D/TEC). As part of your duties, you will be responsible for the following tasks related to Earth observation (EO
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component/material obsolescence and actions aimed at reducing recurrent costs during the exploitation phase. Technical competencies Strong background in the design, development, assembly, integration, testing
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, Microelectronics and Components Technology Division, Electrical Department, Directorate of Technology, Engineering and Quality. The Microelectronics Section provides functional support to ESA projects and carries
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to work in a multi-cultural environment, both independently and as part of a team. Your motivation, overall professional perspective and career goals will also be explored during the later stages
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of subsystem components across the entire project lifecycle. System budgets management and risk mitigation actions tailored to subsystem responsibilities. Support to AIV (Assembly, Integration, and Verification
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across the technical domains of Quality, Dependability and Safety, Materials and Processes, EEE Components and Quality and Space Debris Mitigation at system level. This includes ensuring a consolidated
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assessing and managing co-funded activities for commercial Earth Observation (EO), in particular within the InCubed (Investing in Industrial Innovation) Earth Watch programme element. You are a technical
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programmatic support in assessing and managing co-funded activities for commercial Earth Observation (EO), in particular within the InCubed (Investing in Industrial Innovation) Earth Watch programme element. You
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. The Payload Validation Section is responsible for conducting laboratory-based payload element validation activities, with an emphasis on imaging focal plane technologies, to provide support for the development
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of the schedule for TIR and proposing schedule risk mitigation actions; coordinating instrument components procured from ESA Member States (such as detectors or a CFI) to ensure compatibility with overall