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issues. Position Description The position will support the operation and continued development of a center for high throughput x-ray crystallographic fragment screening (XCFS). The successful candidate
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secondary electron detector for surface imaging at the atomic scale, and hybrid-pixel detector for 4D-STEM. The second STEM will be an ultra-high vacuum environmental STEM with nine orders of magnitude
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Synchrotron (RCS). This role offers an opportunity to make key contributions to the safe, reliable, and efficient operation of one of DOE’s flagship accelerator projects. Essential Duties and Responsibilities
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microscopy, planned experiments will include atomic-scale imaging, high energy-resolution electron energy-loss spectroscopy (EELS), 4D scanning transmission electron microscopy (STEM), and cryogenic microscopy
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at the Computational Science Initiative (CSI), within the Brookhaven National Laboratory. The selected candidate will collaborate on solving inverse problem, relevant for interference lithography process, by deploying
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studies and computer simulations Collaborate with the BMAD development team at Cornell University by implementing new features into the code Participate in the EIC design effort in a more general sense
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durations (up to 8 hours per day) Preferred Knowledge, Skills, and Abilities: Experience with weather instrumentation operation (lidar, radar, weather station, radiometer, sonde, cameras) Experience with
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well as associated materials and device physics. You have demonstrated experimental experience in nanofabrication processes (e.g., electron-beam lithography, physical vapor deposition, atomic layer deposition etc
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://www.directives.doe.gov/directives-documents/400-series/0486.1-BOrder-a/@@images/file Equal Opportunity/Affirmative Action Employer Brookhaven Science Associates is an equal opportunity employer that values inclusion and
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of existing ones for scientific applications; (ii) Large Language Models (LLMs) and multi-modal Foundation Models (iii) Large vision-language models (VLM) and computer vision techniques; and (iv) techniques