Sort by
Refine Your Search
-
controlled environment, and as a function of external stimuli. This position requires high-resolution electron microscopy imaging, diffraction studies and analytical investigations of low-Z materials. Our
-
be involved in comprehensive dynamic characterization of electron beam-sensitive materials, including the characterization in hydrated state, under controlled environment, and as a function of external
Searches related to automatic control
Enter an email to receive alerts for automatic-control positions