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systems, such as cells, engineered to sense and respond in programmed ways. Importantly, building these systems both requires and advances meaningful quantitation of the effects of environmental context and
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are seeking researchers to contribute to the development and application of advanced measurement and automation techniques for exploring processing-structure-property-performance (PSPP) relationships in
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other commerical and residential applications. Examples include: Per and polyfluoroalkyl substances (PFAS)-Fire Fighter Gear Research · determining the risk of firefighter’s being exposed to PFAS
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correlations and prediction methods. The program will build on our existing efforts using Quantitative Structure-Property Relationship (QSPR) methodologies and modern machine learning methods (support vector
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Description This program is designed to support the design, construction, and operation of high-performance sustainable buildings with good indoor environments and low levels of energy consumption. This goals
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switched with single-flux-quantum (SFQ) pulses. Candidates interested in the logic aspects of this program should contact Sam Benz. Candidates interested in the magnetic memory aspects of this project should
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transitions. Many x-ray lines and satellites remain to be experimentally verified, in comparison with theory. We have a program to carry out these investigations using TES microcalorimeter detectors with 5 eV
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the “NIST-on-a-chip” program, we are designing and building chip-scale accelerometers as field-deployable SI-traceable standards. The accelerometers employ a micromechanical structure in conjunction with a
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301.975.8582 Michael Garth Huber michael.huber@nist.gov 301 975 5641 Description This program explores complementary aspects of atom and neutron interferometry with particular emphasis on their interplay with
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@nist.gov 301.975.3958 Description Scanning electron microscopy (SEM) is used for metrology of nanometer-scale features in semi-conductor electronics applications and for emerging nanotechnologies. SEM