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highly complex workflows. We aim to develop optimization models and algorithms to improve wafer processing sequences across semiconductor manufacturing tools, with the objectives of reducing cycle times
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wafers are processed across hundreds or even thousands of manufacturing tools following highly complex workflows. We aim to develop optimization models and algorithms to improve wafer processing sequences
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deep learning models with state-of-the-art algorithms based on histology whole slide images. They may also contribute to research of integration of multimodality data with clinical, radiological images
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