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in materials characterization usingadvanced electron microscopy, including: Scanning Electron Microscopy (SEM), Electron Back Scatter Diffraction (EBSD), Electron Channeling Contrast Imaging (ECCI
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), Electron Channeling Contrast Imaging (ECCI), and Scanning/Transmission Electron Microscopy (S/TEM). The ideal candidate will have experience applying these techniques to understand deformation mechanisms
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